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The Parallel Test Equipment of Sunright, focuses on the design, development and delivery of hardware and software products that lower burn-in parallel test costs of our customers. These products range from sophisticated parallel test burn-in systems, to cleverly conceived handling and storage products to protect and extend parallel test board (PTB/BIB) life. The entire process comes together under the Yield Efficiency Solution (“YES”) domain where the process is managed from incoming tray to outgoing sorted device. |
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The patented Test After Load (TAL) process that guarantees optimized socket usage |
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The highest density of test resources to/from a Parallel Test Boards (PTB/BIB), enabling high productivity and output |
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Integrated data management between loaders and systems |
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Hands-off movement and usage of Parallel Test Boards (PTB/BIB) |
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