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The Parallel Test
Equipment of Sunright,
focuses on the design, development and delivery of hardware and
software products that lower burn-in parallel test costs of our
customers. These products range from sophisticated parallel test
burn-in systems, to cleverly conceived handling and storage products to
protect and extend parallel test board (PTB/BIB) life. The entire
process comes together under the Yield Efficiency Solution
(“YES”) domain where the process is managed from
incoming tray to outgoing sorted device. |
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key technologies we provide include: |
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The patented
Test After Load (TAL) process that guarantees optimized socket usage |
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The highest
density of test resources to/from a Parallel Test Boards (PTB/BIB),
enabling high productivity and output |
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Integrated
data management between loaders and systems |
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Hands-off
movement and usage of Parallel Test Boards (PTB/BIB) |
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